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"Test limitations of parametric faults in analog circuits."

Jacob Savir, Zhen Guo (2003)

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DOI: 10.1109/TIM.2003.818541

access: closed

type: Journal Article

metadata version: 2020-06-08

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Jacob Savir, Zhen Guo:
Test limitations of parametric faults in analog circuits. IEEE Trans. Instrum. Meas. 52(5): 1444-1454 (2003)

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