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"Substrate noise measurement by using noise-selective voltage comparators ..."

Keiko Makie-Fukuda, Takanobu Anbo, Toshiro Tsukada (1999)

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DOI: 10.1109/19.816115

access: closed

type: Journal Article

metadata version: 2020-06-08

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Keiko Makie-Fukuda, Takanobu Anbo, Toshiro Tsukada:
Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits. IEEE Trans. Instrum. Meas. 48(6): 1068-1072 (1999)

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