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"Shape and surface measurement technology by an improved shape-from-shading ..."

Siu-Yeung Cho, Tommy W. S. Chow (2000)

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DOI: 10.1109/41.824148

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tie/ChoC00
Siu-Yeung Cho, Tommy W. S. Chow:
Shape and surface measurement technology by an improved shape-from-shading neural algorithm. IEEE Trans. Ind. Electron. 47(1): 225-230 (2000)

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