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"Energy and Delay Tradeoffs of Soft-Error Masking for 16-nm FinFET Logic ..."

Faris S. Alghareb et al. (2017)

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DOI: 10.1109/TCSII.2016.2587763

access: closed

type: Journal Article

metadata version: 2021-06-09

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Faris S. Alghareb, Rizwan A. Ashraf, Ahmad Alzahrani, Ronald F. DeMara:
Energy and Delay Tradeoffs of Soft-Error Masking for 16-nm FinFET Logic Paths: Survey and Impact of Process Variation in the Near-Threshold Region. IEEE Trans. Circuits Syst. II Express Briefs 64-II(6): 695-699 (2017)

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