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"Fault testing for reversible circuits."

Ketan N. Patel, John P. Hayes, Igor L. Markov (2004)

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DOI: 10.1109/TCAD.2004.831576

access: closed

type: Journal Article

metadata version: 2020-09-24

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Ketan N. Patel, John P. Hayes, Igor L. Markov:
Fault testing for reversible circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(8): 1220-1230 (2004)

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