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"Globally Reliable Variation-Aware Sizing of Analog Integrated Circuits via ..."

Trent McConaghy, Georges G. E. Gielen (2009)

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DOI: 10.1109/TCAD.2009.2030351

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/McConaghyG09a
Trent McConaghy, Georges G. E. Gielen:
Globally Reliable Variation-Aware Sizing of Analog Integrated Circuits via Response Surfaces and Structural Homotopy. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1627-1640 (2009)

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