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"Hyperneural Network-An Efficient Model for Test Generation in Digital ..."

Suresh Rai, Weian Deng (1996)

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DOI: 10.1109/12.481493

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/RaiD96
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  persistent URL:
  - https://dblp.org/rec/journals/tc/RaiD96
Suresh Rai, Weian Deng:
Hyperneural Network-An Efficient Model for Test Generation in Digital Circuits. IEEE Trans. Computers 45(1): 115-121 (1996)

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