default search action

combined dblp search
author search
venue search
publication search

ask others

"On the Effect of Defect Clustering on Test Transparency and IC Test ..."

Adit D. Singh, C. Mani Krishna (1996)

> Home

Details and statistics

DOI: 10.1109/12.506431

access: closed

type: Journal Article

metadata version: 2022-09-10

- view
  authority control:
- export record
  dblp key:
  - journals/tc/SinghK96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/SinghK96
Adit D. Singh, C. Mani Krishna:
On the Effect of Defect Clustering on Test Transparency and IC Test Optimization. IEEE Trans. Computers 45(6): 753-757 (1996)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.