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"Intrinsic response for analog module testing using an analog testability bus."

Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou (2001)

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DOI: 10.1145/375977.375981

access: closed

type: Journal Article

metadata version: 2018-11-06

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Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou:
Intrinsic response for analog module testing using an analog testability bus. ACM Trans. Design Autom. Electr. Syst. 6(2): 226-243 (2001)

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