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"Dynamically Determined Preferred Values and a Design-for-Testability ..."

Irith Pomeranz (2018)

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DOI: 10.1145/3219778

access: closed

type: Journal Article

metadata version: 2018-11-21

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Irith Pomeranz:
Dynamically Determined Preferred Values and a Design-for-Testability Approach for Multiplexer Select Inputs under Functional Test Sequences. ACM Trans. Design Autom. Electr. Syst. 23(5): 59:1-59:16 (2018)

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