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"Cascading failures modeling of electronic circuits with degradation using ..."

Yi Jin et al. (2023)

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DOI: 10.1016/J.RESS.2023.109101

access: closed

type: Journal Article

metadata version: 2023-03-28

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Yi Jin, Qingyuan Zhang, Yunxia Chen, Zhendan Lu, Tianpei Zu:
Cascading failures modeling of electronic circuits with degradation using impedance network. Reliab. Eng. Syst. Saf. 233: 109101 (2023)

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