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"Hot carrier effect on a single SiGe HBT's EMI response."

Cen Xiong et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.09.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/XiongLLTZH15
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  - https://dblp.org/rec/journals/mr/XiongLLTZH15
Cen Xiong, Yonghong Li, Shuhuan Liu, Du Tang, Jinxin Zhang, Chaohui He:
Hot carrier effect on a single SiGe HBT's EMI response. Microelectron. Reliab. 55(12): 2627-2633 (2015)

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