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"Hydrogen in MOSFETs - A primary agent of reliability issues."

Sokrates T. Pantelides et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.10.011

access: closed

type: Journal Article

metadata version: 2024-03-26

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  - https://dblp.org/rec/journals/mr/PantelidesTRZFS07
Sokrates T. Pantelides, L. Tsetseris, Sergey N. Rashkeev, X. J. Zhou, Daniel M. Fleetwood, Ronald D. Schrimpf:
Hydrogen in MOSFETs - A primary agent of reliability issues. Microelectron. Reliab. 47(6): 903-911 (2007)

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