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"NBTI related degradation and lifetime estimation in p-channel power ..."

Ivica Manic et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.004

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/mr/ManicDPDDGPS11
Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic:
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions. Microelectron. Reliab. 51(9-11): 1540-1543 (2011)

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