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"Study of Area Scaling Effect on Integrated Circuit Reliability Based on ..."

Changsoo Hong et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.011

access: closed

type: Journal Article

metadata version: 2022-01-03

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Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin:
Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectron. Reliab. 45(9-11): 1305-1310 (2005)

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