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"Significance of the failure criterion on transmission line pulse testing."

Bart Keppens et al. (2002)

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DOI: 10.1016/S0026-2714(02)00053-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/KeppensHIVG02
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  - https://dblp.org/rec/journals/mr/KeppensHIVG02
Bart Keppens, Vincent De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken:
Significance of the failure criterion on transmission line pulse testing. Microelectron. Reliab. 42(6): 901-907 (2002)

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