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"Scan flip-flops with on-line testing ability with respect to input delay ..."

Cecilia Metra et al. (2003)

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DOI: 10.1016/S0026-2692(02)00125-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/MetraFFR03
Cecilia Metra, Stefano Di Francescantonio, Michele Favalli, Bruno Riccò:
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults. Microelectron. J. 34(1): 23-29 (2003)

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