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"Analyzing close relations between target artifacts for improving IR-based ..."
Haijuan Wang et al. (2021)
- Haijuan Wang, Guohua Shen, Zhiqiu Huang, Yaoshen Yu, Kai Chen:
Analyzing close relations between target artifacts for improving IR-based requirement traceability recovery. Frontiers Inf. Technol. Electron. Eng. 22(7): 957-968 (2021)
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