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"Secure and Testable Scan Design Utilizing Shift Register Quasi-equivalents."
Katsuya Fujiwara, Hideo Fujiwara, Hideo Tamamoto (2013)
- Katsuya Fujiwara, Hideo Fujiwara, Hideo Tamamoto:
Secure and Testable Scan Design Utilizing Shift Register Quasi-equivalents. IPSJ Trans. Syst. LSI Des. Methodol. 6: 27-33 (2013)
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