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"Identifying critical success factors in EDA industry using DEMATEL method."

Chia-Chi Sun (2015)

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DOI: 10.1080/18756891.2015.1001945

access: open

type: Journal Article

metadata version: 2018-10-16

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  dblp key:
  - journals/ijcisys/Sun15
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  - https://dblp.org/rec/journals/ijcisys/Sun15
Chia-Chi Sun:
Identifying critical success factors in EDA industry using DEMATEL method. Int. J. Comput. Intell. Syst. 8(2): 208-218 (2015)

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