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"Testing and Delay-Monitoring for the High Reliability of Memory-Based ..."

Xihong Zhou et al. (2024)

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DOI: 10.1587/TRANSINF.2023EDP7101

access: closed

type: Journal Article

metadata version: 2024-02-01

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Xihong Zhou, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi:
Testing and Delay-Monitoring for the High Reliability of Memory-Based Programmable Logic Device. IEICE Trans. Inf. Syst. 107(1): 60-71 (2024)

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