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"Verification of Stable Circuit Operation of 180 nm Current Controlled MOS ..."

Masashi Kamiyanagi et al. (2011)

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DOI: 10.1587/TRANSELE.E94.C.760

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/KamiyanagiISNE11
Masashi Kamiyanagi, Takuya Imamoto, Takeshi Sasaki, Hyoungjun Na, Tetsuo Endoh:
Verification of Stable Circuit Operation of 180 nm Current Controlled MOS Current Mode Logic under Threshold Voltage Fluctuation. IEICE Trans. Electron. 94-C(5): 760-766 (2011)

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