default search action

combined dblp search
author search
venue search
publication search

ask others

"Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability."

Song Bian et al. (2016)

> Home

Details and statistics

DOI: 10.1587/TRANSFUN.E99.A.1400

access: closed

type: Journal Article

metadata version: 2024-06-17

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/BianSHS16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/BianSHS16
Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato:
Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 99-A(7): 1400-1409 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.