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"Connecting fabrication defects to fault models and SPICE simulations for ..."

Vincent Mao et al. (2009)

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DOI: 10.1049/IET-CDT.2008.0136

access: closed

type: Journal Article

metadata version: 2022-01-03

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Vincent Mao, V. Thusu, Chris Dwyer, Krishnendu Chakrabarty:
Connecting fabrication defects to fault models and SPICE simulations for DNA self-assembled nanoelectronics. IET Comput. Digit. Tech. 3(6): 553-569 (2009)

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