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"Diagnostic test-pattern generation targeting open-segment defects and its ..."

Y.-H. Chen, C.-L. Chang, Charles H.-P. Wen (2012)

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DOI: 10.1049/IET-CDT.2011.0121

access: closed

type: Journal Article

metadata version: 2022-07-03

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Y.-H. Chen, C.-L. Chang, Charles H.-P. Wen:
Diagnostic test-pattern generation targeting open-segment defects and its diagnosis flow. IET Comput. Digit. Tech. 6(3): 186-193 (2012)

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