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"Scalable model for predicting the effect of negative bias temperature ..."

Sarvesh Bhardwaj et al. (2008)

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DOI: 10.1049/IET-CDS:20070225

access: closed

type: Journal Article

metadata version: 2020-09-10

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  - https://dblp.org/rec/journals/iet-cds/BhardwajWVCV08
Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda, Yu Cao, Sarma B. K. Vrudhula:
Scalable model for predicting the effect of negative bias temperature instability for reliable design. IET Circuits Devices Syst. 2(4): 361-371 (2008)

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