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"A reconfigurable test method based on LFSR for 3D stacking integrated ..."

Chen Tian et al. (2022)

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DOI: 10.1016/J.VLSI.2022.06.011

access: closed

type: Journal Article

metadata version: 2022-10-13

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  - https://dblp.org/rec/journals/integration/TianLJLLY22
Chen Tian, Jianyong Lu, Liu Jun, Huaguo Liang, Yingchun Lu, Maoxiang Yi:
A reconfigurable test method based on LFSR for 3D stacking integrated circuits. Integr. 87: 82-89 (2022)

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