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"Double Node Upsets Hardened Latch Circuits."

Yuanqing Li et al. (2015)

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DOI: 10.1007/S10836-015-5551-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - journals/et/LiWYYGX15
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  - https://dblp.org/rec/journals/et/LiWYYGX15
Yuanqing Li, Haibin Wang, Suying Yao, Xi Yan, Zhiyuan Gao, Jiangtao Xu:
Double Node Upsets Hardened Latch Circuits. J. Electron. Test. 31(5-6): 537-548 (2015)

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