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"Is AI testing beneficial for the manufacturer and social welfare? Optimal ..."

Yanran Li et al. (2024)

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DOI: 10.1016/J.ESWA.2023.122637

access: closed

type: Journal Article

metadata version: 2024-07-19

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Yanran Li, Yan Zheng, Yon Shin Teo, Shangwei Lin:
Is AI testing beneficial for the manufacturer and social welfare? Optimal test strategy of a smart product. Expert Syst. Appl. 241: 122637 (2024)

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