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"A New Approach for Automatic Test Pattern Generation in Register Transfer ..."

Mohammad Mirzaei et al. (2013)

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DOI: 10.1109/MDT.2012.2217471

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/dt/MirzaeiTAN13
Mohammad Mirzaei, Mahmoud Tabandeh, Bijan Alizadeh, Zainalabedin Navabi:
A New Approach for Automatic Test Pattern Generation in Register Transfer Level Circuits. IEEE Des. Test 30(4): 49-59 (2013)

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