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"Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From ..."

Shaji Krishnan, Hans G. Kerkhoff (2013)

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DOI: 10.1109/MDT.2012.2206552

access: closed

type: Journal Article

metadata version: 2020-03-13

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Shaji Krishnan, Hans G. Kerkhoff:
Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. IEEE Des. Test 30(3): 18-24 (2013)

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