C Measurement Without Blanking Time for Short-Circuit Protection of High-Power IPM.">C Measurement Without Blanking Time for Short-Circuit Protection of High-Power IPM., dblp, computer science, bibliography, knowledge graph, author, editor, publication, conference, journal, book, thesis, database, collection, open data, bibtex">

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"A Novel IC Measurement Without Blanking Time for Short-Circuit ..."

Zhaoliang Meng et al. (2020)

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DOI: 10.1109/ACCESS.2020.2984542

access: open

type: Journal Article

metadata version: 2023-03-26

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  dblp key:
  - journals/access/MengYGAFWW20
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  - https://dblp.org/rec/journals/access/MengYGAFWW20
Zhaoliang Meng, Yuan Yang, Yong Gao, Shengsheng Ai, Zhengpeng Fang, Yang Wen, Lei Wu:
A Novel I_C Measurement Without Blanking Time for Short-Circuit Protection of High-Power IPM. IEEE Access 8: 64475-64485 (2020)

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