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"Data analytics to reduce stop-on-fail test in electronics manufacturing."

Ana Elsa Hinojosa Herrera et al. (2019)

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DOI: —

access: closed

type: Journal Article

metadata version: 2020-03-04

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  dblp key:
  - journals/cejcs/HerreraSBWY19
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  - https://dblp.org/rec/journals/cejcs/HerreraSBWY19
Ana Elsa Hinojosa Herrera, Stoyan Stoyanov, Chris Bailey, Chris Walshaw, Chunyan Yin:
Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Comput. Sci. 9(1): 200 (2019)

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