default search action

combined dblp search
author search
venue search
publication search

ask others

"Comparing different solutions for testing resistive defects in low-power ..."

Nunzio Mirabella et al. (2021)

> Home

Details and statistics

DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-01-05

- view
  - electronic edition @ arxiv.org (open access)
- export record
  dblp key:
  - journals/corr/abs-2112-15176
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2112-15176
Nunzio Mirabella, Michelangelo Grosso, Giovanna Franchino, Salvatore Rinaudo, Ioannis Deretzis, Antonino La Magna, Matteo Sonza Reorda:
Comparing different solutions for testing resistive defects in low-power SRAMs. CoRR abs/2112.15176 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.