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"A study of impacts of ESD protection on 28/38GHz RF switches in 45nm SOI ..."

Chenkun Wang et al. (2018)

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DOI: 10.1109/RWS.2018.8304973

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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  - conf/rws/WangLCZLWW18
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Chenkun Wang, Fei Lu, Qi Chen, Feilong Zhang, Cheng Li, Dawn Wang, Albert Z. Wang:
A study of impacts of ESD protection on 28/38GHz RF switches in 45nm SOI CMOS for 5G mobile applications. RWS 2018: 157-160

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