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"Detecting Trapdoors in Smart Cards Using Timing and Power Analysis."

Jung Youp Lee, Seok Won Jung, Jongin Lim (2005)

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DOI: 10.1007/11430230_19

access: open

type: Conference or Workshop Paper

metadata version: 2022-11-18

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  - conf/pts/LeeJL05
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Jung Youp Lee, Seok Won Jung, Jongin Lim:
Detecting Trapdoors in Smart Cards Using Timing and Power Analysis. TestCom 2005: 275-288

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