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"A Parallel Approach Solving the Test Generation Problem for Synchronous ..."

H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus (1997)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2013-05-26

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  dblp key:
  - conf/parco/DahmenGV97
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  persistent URL:
  - https://dblp.org/rec/conf/parco/DahmenGV97
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus:
A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits. PARCO 1997: 549-556

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