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"Improved Random Pattern Delay Fault Coverage Using Inversion Test Points."

Soham Roy et al. (2019)

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DOI: 10.1109/NATW.2019.8758727

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-16

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  dblp key:
  - conf/natw/RoySMA19
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Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal:
Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. NATW 2019: 1-6

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