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"Combining Instance-Based Learning and Logistic Regression for Multilabel ..."

Weiwei Cheng, Eyke Hüllermeier (2009)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2015-09-29

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  dblp key:
  - conf/lwa/ChengH09
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  persistent URL:
  - https://dblp.org/rec/conf/lwa/ChengH09
Weiwei Cheng, Eyke Hüllermeier:
Combining Instance-Based Learning and Logistic Regression for Multilabel Classification. LWA 2009: KDML:22-29

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