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"Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory."

Jacob Savir, William H. McAnney, Salvatore R. Vecchio (1985)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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  dblp key:
  - conf/itc/SavirMV85
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  persistent URL:
  - https://dblp.org/rec/conf/itc/SavirMV85
Jacob Savir, William H. McAnney, Salvatore R. Vecchio:
Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory. ITC 1985: 100-105

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