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"Defect injection, Fault Modeling and Test Algorithm Generation Methodology ..."

Sarath Mohanachandran Nair et al. (2018)

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DOI: 10.1109/TEST.2018.8624725

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-31

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  dblp key:
  - conf/itc/NairBTTGHZ18
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  - https://dblp.org/rec/conf/itc/NairBTTGHZ18
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian:
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC 2018: 1-10

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