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"CMOS Built-In Test Architecture for High-Speed Jitter Measurement."

Henry C. Lin et al. (2003)

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DOI: 10.1109/TEST.2003.1270826

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/LinTCCSHHB03
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  persistent URL:
  - https://dblp.org/rec/conf/itc/LinTCCSHHB03
Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz:
CMOS Built-In Test Architecture for High-Speed Jitter Measurement. ITC 2003: 67-76

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