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"A scanisland based design enabling prebond testability in die-stacked ..."

Dean L. Lewis, Hsien-Hsin S. Lee (2007)

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DOI: 10.1109/TEST.2007.4437621

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dean L. Lewis, Hsien-Hsin S. Lee:
A scanisland based design enabling prebond testability in die-stacked microprocessors. ITC 2007: 1-8

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