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"A study of test quality/tester scan memory trade-offs using the SEMATECH ..."

Kenneth M. Butler (1999)

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DOI: 10.1109/TEST.1999.805815

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kenneth M. Butler:
A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. ITC 1999: 839-847

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