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"Proceedings IEEE International Test Conference 1992, Discover the New ..."

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DOI: —

access: closed

type: Editorship

metadata version: 2019-10-16

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  - conf/itc/1992
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  - https://dblp.org/rec/conf/itc/1992
Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. IEEE Computer Society 1992, ISBN 0-7803-0760-7 [contents]

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