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"Physical-aware diagnosis of multiple interconnect defects."

Po-Hao Chen et al. (2017)

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DOI: 10.1109/ITC-ASIA.2017.8097108

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-13

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  dblp key:
  - conf/itc-asia/ChenLCCL17
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  - https://dblp.org/rec/conf/itc-asia/ChenLCCL17
Po-Hao Chen, Chi-Lin Lee, Jing-Yu Chen, Po-Wei Chen, James Chien-Mo Li:
Physical-aware diagnosis of multiple interconnect defects. ITC-Asia 2017: 40-45

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