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"Test-Plan Optimization for Flying-Probes In-Circuit Testers."

Luciano Bonaria et al. (2019)

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DOI: 10.1109/ITC-ASIA.2019.00017

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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  dblp key:
  - conf/itc-asia/BonariaRSR19
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  - https://dblp.org/rec/conf/itc-asia/BonariaRSR19
Luciano Bonaria, Maurizio Raganato, Giovanni Squillero, Matteo Sonza Reorda:
Test-Plan Optimization for Flying-Probes In-Circuit Testers. ITC-Asia 2019: 19-24

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