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"Electromigration limits of copper nano-interconnects."

Houman Zahedmanesh et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405091

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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  - conf/irps/ZahedmaneshPTC21
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  - https://dblp.org/rec/conf/irps/ZahedmaneshPTC21
Houman Zahedmanesh, Olalla Varela Pedreira, Zsolt Tokei, Kristof Croes:
Electromigration limits of copper nano-interconnects. IRPS 2021: 1-6

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