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"Localized thermal effect of sub-16nm FinFET technologies and its impact on ..."
Yongsheng Sun et al. (2015)
- Yongsheng Sun, Canhui Zhan, Jianping Guo, Yiwei Fu, Guangming Li, Jun Xia:
Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies. IRPS 2015: 3
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