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"Repetitive Pulse Testing for LDMOS Transistor Reliability."

Tianjiao Liu, Michael Cook, Chris Kendrick (2024)

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DOI: 10.1109/IRPS48228.2024.10529360

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  dblp key:
  - conf/irps/LiuCK24
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Tianjiao Liu, Michael Cook, Chris Kendrick:
Repetitive Pulse Testing for LDMOS Transistor Reliability. IRPS 2024: 50

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